describe the operation pricicple of SEM and AFM( contact mode and tapping mode)?

Question

SEM=scanning electrone micrsocopy and AFM=atomic force microscopy

Answer 1

An SEM fires a beam of highly energized electrons at the surface being examined, and the subsequent emission of electrons by the surface is what provides the data that is used to create an image of the surface. An AFM, on the other hand, uses atomic and molecular forces for imaging purposes. The AFM contains a nanoscale, cantilevered probe that is brought almost into contact with the sample, and forces such as mechanical contact force, Van der Waals forces, chemical bonding forces, electrostatic forces, and magnetic forces are measured and used to image the surface.