what is the differences between XRF and EDX?

Answer 1

It would seem that XRF and EDX are types of Bulk Chemical Analysis Methods.

EDX is direct excitation where an x-ray beam is pointed directly at a sample. Filter made of various elements may be placed between the source and sample to increase the excitation of the element of interest or reduce the background in the region of interest.

XRF uses a secondary target, where the source points at the target, the target element is excited and fluoresces, and then the target fluorescence is used to excite the sample.

==== Basic info

Here are the basic definitions from Wiki - as usual, always verify Wiki info. I'm not an expert in spectroscopy, bu I scanned these two articles and it would appear that someone has spent a good deal of time adding what looks to be good information.

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
http://en.wikipedia.org/wiki/X-ray_fluorescence

Energy dispersive X-ray spectroscopy (EDS or EDX) is an analytical tool predominantly used for chemical characterization. Being a type of spectroscopy, it relies on the investigation of a sample through interactions between light and matter, analyzing X-rays in its particular case. Its characterization capabilities are due in large part to the fundamental principle that each element of the periodic table has a unique electronic structure and, thus, a unique response to electromagnetic waves.
http://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy

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Other articles of interest,

=== Some of the equipment used in XRF and EDX spectroscopy

EDX: Energy Dispersive X-ray Fluorescence Spectrometer
Energy Dispersive X-ray fluorescence (EDX) spectrometer is the instrument to perform qualitative and quantitative analyses for elements comprising a material by measuring re-emitted characteristic X-ray from elements. EDX is non-destructive and therefore can be used for various applications like solid, powder, liquid and wafer.

XRF: X-ray Fluorescence Spectrometer

http://www1.shimadzu.com/lab/xrays.html


=== Some descriptions of the pro's and con's of XRF vs EDX

For the detection of tin plated parts, the XRF technique has been found to be a valuable technique that allows the survey of a large number of parts in a short period of time when compared to other techniques such as EDX. It does have limits however. Not all parts can be resolved using just this technique, and some need further examination using EDX analysis. XRF is most suitable for parts with homogeneous surface finish platings. The XRF technique has advantages of portability and can be used in receiving, stores and the production environments. In addition, it can be taken to vendor sites for on-site evaluation.

http://www.irps.org/04-42nd/TP_abstracts.html


=== Other references
http://www.learnxrf.com/index.htm
http://www.scienceofspectroscopy.info/

Answer 2

The most obvious difference (to me, having studied and performed EDX and not XRF) is that Energy-Dispersive X-ray spectroscopy (EDX) uses a focused, high-energy electron beam to create the excitations in the sample, while X-ray Fluorescence (XRF) uses a photon source. In both measurements, the high-energy particles remove core-level electrons from the atoms of the sample, creating core-holes (missing electrons from the electron orbitals). Electrons from higher-energy orbitals in the atoms then relax into these core-holes, and emit radiation of energies characteristic to each atom, which is then measured. The unique energy spacing of the electron orbitals for each element is precisely how these measurements are chemically sensitive.

EDX is generally considered a bulk-sensitive measurement, based loosely on the inelastic mean-free path of the electrons in the electron beam and any secondary electrons that may scatter further into the sample. I would expect that XRF, being a photon-in photon-out process, is also bulk sensitive, and maybe even more-so.

Answer 3

Xrf Vs Xrd

Answer 4

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